Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials : Garmisch-Partenkirchen, October 7-9, 2007.

Frontmatter -- PREFACE -- Table of Contents -- PLANAR FAULTING -- Diffraction analysis of layer disorder -- Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering -- NANOCRYSTALLINE MATERIALS -- Interference phenomena in nanocrystalline materials and their application in the microstructure analysis -- Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources -- Capacitor discharge sintering of nanocrystalline copper -- Microstructure study on BN nanocomposites using XRD and HRTEM -- PLASTIC DEFORMATION -- Impact of dislocation cell elastic strain variations on line profiles from deformed copper -- Determination of stored elastic energy in plastically deformed copper -- Structural studies of submicrocrystalline copper and copper composites by different methods -- Grain stresses and elastic energy in ferritic steel under uniaxial load -- Stress and hardness in surface layers of shot-peened steels -- LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN -- The "state of the art" of the diffraction analysis of crystallite size and lattice strain -- Recent advancements in Whole Powder Pattern Modelling -- On the simulation of the anisotropic peak broadening in powder diffraction -- XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process -- Cumulants and moments in the line profile analysis -- X-ray line-broadening analysis of dislocations in a single crystal of Zr -- XRD line profile analysis of calcite powders produced by high energy milling -- Refining real structure parameters of disordered layer structures within the Rietveld method -- Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation -- MATERIALS MICROSTRUCTURE -- Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films -- Structural and optical properties of AgInSe2 films -- In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor -- Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium -- Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments -- Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods -- Refinement of extinction-affected X-ray reflection profile of textures -- STRESSES AND STRAINS -- Diffraction analysis of elastic strains in micro- and nanostructures -- Determination of residual stress at weld interruptions by neutron diffraction -- Residual stress and elastic anisotropy in the Ti-Al-(Si-)N and Cr-Al-(Si-)N nanocomposites deposited by cathodic arc evaporation -- In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants -- THIN FILMS -- Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction -- X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and - symmetry -- Magnetron deposited TiO2 thin films - crystallization and temperature dependence of microstructure and phase composition -- Influence of reactive plasmas on thin nickel films -- Author Index

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Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.

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